|
Eighteen-year olds who used DataFurnace to analyse high dose Fe implants in Si (see text)
The IBA DataFurnace v6.5
WINDF: a Windows interface
to the DataFurnace code for analysing IBA data
University of Surrey Ion Beam
Centre, Guildford, England
N.P.Barradas1,
R.P.Webb, C.Jeynes
1 Now at: Instituto Tecnológico e Nuclear, Sacavém,
Portugal
This paper was presented at the IBA-14 conference
in Dresden, July 1999
Eighteen-year olds who used
DataFurnace to analyse high dose Fe implants in Si (see Fig.1)
Abstract
Recently the inverse problem for Rutherford backscattering spectrometry
was solved using the simulated annealing algorithm - the DataFurnace. Since
then this code has been generalised to include ERD, a proper calculation
of straggle with depth, and self consistent fitting of multiple spectra
from the same sample. An ad-hoc treatment of multiple and plural scattering
allows data to be fitted closely. A Bayesian code has been implemented
to calculate error bars on profiles obtained. Non-resonant NRA data and
non-Rutherford scattering are treated correctly and generally.
We have now packaged this code as a Windows program to facilitate the
use of NDF on-line and in routine analysis. The input/output has been regularised
in a convenient graphical user interface. Spectral analysis tools have
been incorporated in an integrated package. The aim is to speed up spectral
analysis so that sample analysis can be completed on-line: essential for
timely results, or to reveal the need for further data with a different
experimental configuration.
The further aim of the package is to encourage the collection of large
data sets, with multiple geometry or multiple detector (or both) sample
analysis. In the past this was effectively precluded by the time required
to extract profiles from many spectra. This package unlocks the power of
IBA since it is now feasible to collect many spectra and analyse them immediately
and automatically.
Introduction
At the last IBA-13 conference we described the recently announced [1]
RBS DataFurnace in detail [2,3,4]. This is a code based on the Simulated
Annealing (SA) algorithm [5] giving a practical general solution of the
inverse RBS problem (that is, given the spectrum, what is the depth profile?).
Since then we have generalised this code to treat ERD (including ToF-ERD)
[6], non-resonant NRA [7] and non-Rutherford backscattering [8]. Therefore
we now call it the IBA DataFurnace although we have not yet implemented
PIXE.
A proper treatment of the energy resolution as a function of depth has
been given by Szilágyi et al [9], and this is used to permit
high depth-resolution data to be extracted accurately [10]. Because the
SA algorithm is implemented using Markov Chain Monte Carlo (MCMC) mathematics,
Bayesian techniques are natural for calculating confidence intervals on
the depth profiles extracted from the data [11,12,13]. The intrinsic ambiguity
of RBS and related data [14] (not to mention the cost of beam time) implies
a pressure to collect multiple spectra simultaneously. We have provided
facilities to systematically handle multiple spectra self-consistently
at little extra effort to the analyst (examples in most of our latter cited
papers).
Because of the intrinsic ambiguity of the data in the general case,
extra general facilities have been introduced to exclude unacceptable solutions.
A "molecule" option allows the analyst to ask for solutions in terms of
the compounds known to be present in the sample [15]: something similar
was done previously by Butler [16] but with a completely different methodology.
Two other functions have also proved useful in the analysis of complex
optical multilayers on float glass [17]: forcing the code to assume pure
layers can dramatically reduce the dimensionality of the problem, as can
specifying one of the elements (or molecules) explicitly as a substrate.
The DataFurnace code was previously made available to the community
as a DOS program with no help for the user in the graphics handling of
the output. We now describe a Windows package designed to make this output
immediately accessible, and including a greatly enhanced core code containing
all the facilities mentioned above.
Outline of the DataFurnace code
The inputs to NDF ("Nuno's DataFurnace") are: the data (the measured
spectra), the analytical conditions, any special modifiers to the data,
and any restrictions the user wishes to impose on the solution space. We
will consider these in turn. Notice that the analyst does not have to make
any initial guess at the solution, nor does he or she have to input
any sort of layer structure. This is a fitting, not a simulation
code, although of course access to standard simulation is built in.
The stopping power database used [18] is given in a standard format in
separate files.
The outputs are: a text file of the results giving a summary of input
files and conditions used and the layer structure of the solution found,
a text file logging the progress of the calculations (including start and
end times). Text files (also suitable for input to other graphics programs)
are also output showing: data and fits, that is the measured spectra and
the spectra calculated from the best fit solution (including how the fits
are made up from different elemental signals). The solution obtained is
also output as an elemental concentration in at% against depth in atoms/cm2,
as is a utility for showing the measured histogram data directly on a depth
scale.
NDF takes the input data and searches systematically through solution
space for a solution consistent with the data. IBA data may be badly ambiguous,
and the analyst may have to exclude parts of the solution space to avoid
the choice of valid but unacceptable solutions by the code. We have developed
a series of general tools to facilitate this.
The use of NDF generates a very large number of files (for example,
the analysis of 22 CNx:H samples has left a directory with well over 2000
files), and to provide a convenient GUI (graphical user interface) for
the analyst we have developed WiNDF ("Windows NDF").
WiNDF: Overview
Fig.1 shows the main window of WiNDF. NDF works in a single directory
shown in the Directory box. There are six spectra to be analysed simultaneously,
all taken from this sample #1 with the experimental conditions given by
the Geometry files and the sample elements given by the Structure file.
The user selects the spectra and the geometry files required with a standard
dialogue box, and then associates a geometry with each spectrum. In this
case glancing incidence RBS spectra (at 2 angles) and ERD spectra (at 3
angles) together with a normal incidence RBS spectrum were all collected
for the same sample. The collected charge is read
from the data or entered by the user, and all this is saved in the Batch
file "batch1" (in the banner). Similar information for further samples
can be added to the batch file. Fits for individual samples or for the
whole batch (or sub-sets thereof) can be run. Simulations for specified
layer structures are also convenient to run and display.
Figure 1: The DataFurnace main window
showing a standard file selection sub-window (see text)
Use of WiNDF to solve complex IBA data
Fig.2 is an example of how WiNDF can be used by the inexperienced to
extract information from complex RBS data. These data came from an investigation
into the ion beam synthesis and annealing behaviour of b-FeSi2
carried out by a group of eighteen year olds under the "CREST" Masterclass
scheme [19]. Qualified staff collected the data and set up the geometry
files, but the students carried out the data analysis and obtained depth
profiles for a large set of 12 samples, essentially unaided, in less than
a day.
Numbering the windows in Fig.2 clockwise from top centre, the main window
is #1, and sub-window #3 is the starting data (two spectra collected simultaneously
from 2 detectors at 167 and 135 degrees scattering angle) together with
the fits obtained which are so close as to be almost indistinguishable
from the data. Sub-window #4 is the solution obtained: a depth profile
in at% versus depth (in thin film units) for each element of the sample;
this is a graphical representation of the NDF output shown in sub-window
#2. Sub-window #6 shows the contents of one geometry file: this data is
for a 1MeV 3He+ beam, and NDF needs the beam geometry,
detector energy resolution and solid angle, and the electronics gain calibration
to interpret the data. The geometry file also contains information to apply
various corrections, and information about the range foil (for forward
recoil work) (sub-window #5). Note that with this beam much of the Fe signal
overlaps the Si signal: we could have used a different beam to separate
the signals but this beam was convenient in this case for operational reasons.
Note that this mode of data presentation is its own validation since
the quality of the fit is presented together with the solution. Note also
that the use of a double detector analysis greatly adds to the confidence
in the result since the fit is consistent with both spectra
Figure 2: 1 MeV 3He+ RBS of Fe implants into Si, with annealing,as
analysed by school-leavers (Frontispiece). Numbering the windows clockwise
from top centre: 1) Main window showing filenames of the spectra to be
analysed, filenames of the geometry files, the associations of the spectra
with the geometry, and the collected sharge for each spectrum. The elements
of the sample and any solution space restrictions are in the structure
file. Multiple samples can be analysed, with all this information stored
in the Batch file. The sub windows are: 2) NDF results are output as a
text file. 3) The data and the spectra calculated from the fitted solutions
are almost indistinguishable. 4) The depth profile plotted graphically.
5) a sub-window of: 6) The "geometry" sub-window with beam details, sample
and detector geometry, detector resolution and electronic gain etc.
.
Figure 3 is a different type of case. This is single detector data collected
from a polymer film mounted on a cold stage to minimise beam damage. However,
we are looking for near-surface changes to the film due to its treatment.
The bulk film is of composition (CHF), and the treatment is expected to
effectively turn the surface into (CH) with some other molecules around
represented by free O, S and sodium hydroxide (from the treatment solution).
This sort of data is notoriously ambiguous because the light elements can
exchange for each other giving a wide range of valid "solutions", and we
need to find a way of correlating the signals from different parts of the
spectrum. We can give DataFurnace molecules instead of elements to construct
trial solutions with: in this case the structure specifies three molecules
and two elements (5 free parameters and 6 different elements in the sample,
one of them - H - invisible to RBS). The solution clearly shows the substrate
molecule (CHF) losing fluorine towards the surface. DataFurnace is very
convenient for this sort of problem, since different parametrisations can
easily be tried to see if realistic constraints on the solution space can
actually yield an unambiguous solution.
Figure 3: RBS/ERD data of CNx:H films using C:N ratios from RBS-c
measurements. 1.5MeV normal incidence 4He+ RBS of a fluorinated
polymer after immersion in a defluorinating solution for eight hours. The
structure file specifies the elements and molecules to be used in the fit.
Figure 4 shows our final example: this is of a set of CNx:H
films deposited on silicon where the composition was required. This can
be obtained quite easily with a 1.5MeV He beam by using ERD with a semiconductor
detector and a suitable range foil simultaneously with RBS. The data and
fit are shown in the bottom right sub-window.
There is a problem with this type of data however: the C and N signals
have a rather small signal to noise ratio due to the substrate signal background.
Therefore we determined the C:N ratio separately by a normal incidence
analysis where the beam was aligned with the substrate thereby dramatically
enhancing the signal to noise ratio (data is shown in top right sub-window,
with a cubic fit to the regions of interest shown: there is also some O
in this film). Then this value was supplied as a molecule to the RBS/ERD
data, with the result in the bottom left sub-window (C/N=2.85). The data
is distorted by the large low energy tail on the H ERD signal due to multiple
scattering (this can be minimised by suitably truncating the data given
to NDF - see the "min" & "max" boxes in the geometry window of Fig.2),
and also by small channelling effects in the RBS signal. However, even
with these reservations a reasonable self-consistent fit is obtained. Again,
as the drop down selection box in the main window shows, this batch is
of 22 samples; and since the fits are done without manual interference
the analysis is completed quite objectively.
Figure 4: 1.5MeV 4He+ RBS/ERD data of CNx:H films using C:N ratios
from RBS-c measurements. C/N = 2.85 is determined from
a channelling measurement (top right window). simultaneous RBS/ERD spectra
(glancing beam incidence) and an RBS spectrum (normal incidence).
References
1. N.P.Barradas, C.Jeynes, R.P.Webb, Simulated
annealing analysis of Rutherford backscattering data, Appl.Phys.Lett.
71 (1997) 291-3
2. N.P.Barradas, P.K.Marriott, C.Jeynes, R.P.Webb,
The RBS DataFurnace: Simulated annealing, Nucl. Instr. and Methods
B136-138 (1998) 1157-1162
3. N.P.Barradas, C.Jeynes, M.A.Harry, RBS/simulated
annealing analysis of iron-cobalt silicides, Nucl. Instr. and Methods
B136-138 (1998) 1163-1167
4. N.P.Barradas, C.Jeynes, S.M.Jackson, RBS/simulated
annealing analysis of buried SiCOx layers formed by ion implantation of
O into cubic silicon carbide, Nucl. Instr. and Methods B136-138
(1998) 1168-1171
5. E.Aarts, J.Korst, Simulated Annealing and Boltzmann
Machines: A Stochastic Approach to Combinatorial Optimization and Neural
Computing (John Wiley & Sons, Chichester, 1989)
6. N.P.Barradas, C.Jeynes, R.P.Webb, U.Kreissig, R.Grötzschel,
Unambiguous automatic evaluation of multiple ion beam analysis data
with simulated annealing, Nucl. Instr. and Methods B149
(1999) 233-237
7. N.P.Barradas, S.Parascandola, B.J.Sealy, R.Grötzschel,
U.Kreissig, Simulataneous and consistent analysis of NRA, RBS and ERDA
data with the IBA DataFurnace, Nucl. Instr. and Methods B161-163
(2000) 308-313
8. C. Jeynes, N.P.Barradas, and J.Wilde, Composition
of TaNiC thick films using SimAnn: Elastic Backscattering Spectrometry,
Nucl. Instr. and Methods B161-163 (2000) 287-292
9. E.Szilágyi, F.Pászti & G.Amsel,
Theoretical approximations for depth resolution calculations in IBA
methods, Nucl. Instr. and Methods B100 (1995) 103-121.
DEPTH can be downloaded from http://www.kfki.hu/~ionhp/
10. N.P.Barradas, A.P.Knights, C.Jeynes, O.A.Mironov,
T.J.Grasby, E.H.C.Parker, High-depth-resolution RBS data and error analysis
of SiGe systems using the simulated annealing and Markov Chain Monte Carlo
algorithms, Phys.Rev.B 59(7) (1999) 5097-5105
11. P.K.Marriott, M.Jenkin, C.Jeynes, N.P.Barradas,
R.P.Webb, B.J.Sealy, Rapid accurate automated analysis of complex ion
beam analysis data, CP475, Applications of Accelerators in Research
and Industry (eds. J.L.Duggan, I.L.Morgan, Woodbury, New York: AIP,
1999), pp592-595
12. N.P.Barradas, C.Jeynes, M.Jenkin, P.K.Marriott,
Bayesian Error Analysis of Rutherford Backscattering Spectra, Thin
Solid Films 343-344 (1999) 31-34
13. N.P.Barradas, S.A.Almeida, C.Jeynes, A.P.Knights,
S.R.P.Silva, B.J.Sealy, RBS and ERDA simulated annealing study of ion
beam synthesised gallium nitride, Nucl. Instr. and Methods B148
(1999) 463-467
14. P.F.A.Alkemade, F.H.P.M.Habraken, W.F.van der
Weg, On the ambiguity in the analysis of Rutherford backscattering spectra,
Nucl. Instr. and Methods B45 (1990) 139-142
15. M.Milosavljevic, N.Bibic, K.P.Homewood, C.Jeynes,
Formation of b-FeSi2 by combining ion beam mixing
and thermal processing, Thin Solid Films (in press);
M.Milosavljevic, N.Bibic, D.Perusko, C.Jeynes, U.Bangert, The effects
of implanted arsenic on Titanium silicide formation, in: Special
defects in semiconducting materials ed.R.P.Agarwala, Solid State Phenomena
71 (2000) 142-172 (Scitech publications, Switzerland, 1999)
16. J.W.Butler, Criteria for validity of Rutherford
scatter analysis, Nucl. Instr. and Methods B45 (1990)
160-165
17. C.Jeynes, N.P.Barradas, H.Rafla-Yuan, B.P.Hichwa,
R.Close, Accurate depth profiling of complex optical coatings, Presented
at ECASIA conference, Seville, October, 1999, Surface & Interface Analysis
(in press)
18. J.F.Ziegler, J.P.Biersack, U.Littmark, The
Stopping and Ranges of Ions in Solids (Pergamon Press, New York, 1985)
19. A.Belson, D.Brasted, C.Dawes, S.Mashford, H.Sunnucks,
J.S.Sharpe, C.N.McKinty, M.Kerford, M.A.Lourenço, A. Kewell, T.Butler,
K.P.Homewood, C.Jeynes, R.P.Webb, K.J.Reeson Kirkby, Ion Beam Synthesised
FeSi2 – DEVELOPMENT OF BAND GAP & STRUCTURE DURING ANNEALING, CREST
Masterclass project: Presented at ESPRIT ADVANCED RESEARCH INITIATIVE
IN MICROELECTRONICS (MEL-ARI) Athens, October 1999
|