19th Ion Beam Analysis Conference
19th INTERNATIONAL CONFERENCE ON ION BEAM ANALYSIS
University of Cambridge, UK
7th-11th September, 2009
Celebrating 100 years of Rutherford Backscattering
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Ernest Marsden Programme
Please find below a list of the international invited speakers and the provisional titles for their talks:
  • HH Andersen, G Amsel & I Vickridge (France/Denmark) – “Rutherford Backscattering – the first 100 years… A Historic Perspective on RBS”
  • K Arstila (Belgium) – “Analysis of nano particles with ERD”
  • H Brongersma (Holland) – “From the cradle of LEIS to a commercial scattering spectroscopy instrument”
  • T Butz (Germany) – “Tomography using Ion Beam Techniques”
  • I Campbell (Canada) – “In situ analysis of the Martian surface with ion and photon beams”
  • M Chiari (Italy) – “PESA - State of the art and innovative uses of IBA methods for light element (H,C,N & O) analysis in atmospheric aerosol samples”
  • R Composto (USA) – “Ion Scattering techniques for characterization of polymers and composites”
  • M Doebeli (Germany) – “IBA with High Resolution Gas Ionization Detectors”
  • G Dollinger (Germany) – “High Resolution Elastic Recoil Detection”
  • B Doyle (USA) – “Ion-photo Emission Microscopy”
  • P Grande (Brazil) – “Energy Loss Calculations for MEIS”
  • A Gurbich (Russia) – “Evaluated Differential Cross Sections for IBA”
  • J Kennedy (New Zealand) – “Ion Beam Analysis at Rutherford’s Birthplace”
  • J Matsuo (Japan) – “Molecular Imaging Using MeV SIMS”
  • P Roncin (France) – “Diffraction of high energy (keV to tens of keV) He ions from crystalline surfaces”
  • D Smeets (Canada) - “Real Time IBA using Artificial Neural Networks”


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